The results show that the sampling plane orientation has an important effect on both the mean and the standard deviation of trace lengths. Using the derived expressions, the effect of sampling plane orientation on trace lengths is investigated. From this relationship, expressions are derived between the mean (μ a) and standard deviation (σ a) of the discontinuity size, a, and the mean (μ l) and standard deviation (σ l) of the trace length, l, respectively for log-normal, negative exponential and gamma distributions of discontinuity sizes. For elliptical discontinuities, a general stereological relationship between distributions of trace length and distributions of discontinuity size (expressed by the major axis length, a, of the ellipse) is derived for area (or window) sampling. the ratio of the major to minor axes), many real discontinuities can be reasonably represented.
By assuming an elliptical shape and changing the aspect ratio k of the ellipses (i.e. This is an extension of approaches for estimating size distributions of circular discontinuities. This paper presents an approach for estimating the size distributions of elliptical discontinuities.
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